HarmonyOS 7 (API 26) Beta 2: AI-Enhanced App Fault Analysis for Stability Issue Discovery, Location, and Repair

HarmonyOS 7 (API 26) Beta 2 introduces enhancements to the DFX (Design For eXcellence) framework, focusing on gray-scale collection, APMS clustering, and AI-powered diagnosis to streamline stability issue resolution. The gray-scale collection interface allows developers to collect high-value logs such as RSS memory leaks, GPU anomalies, and ArkTS issues on demand, with configurable policies via AppGallery Connect. APMS clustering analysis groups similar exceptions by stack trace key lines, providing root cause, suspicious code paths, and repair suggestions, while also offering AI analysis to identify key leak points. Additionally, the AI Skill, available in DevEco Code or as open source on GitCode, automates stack parsing, slice extraction, and semantic code association for scenarios like ArkTS object leaks, Native memory leaks, DMA(ION) leaks, and Freeze. A use case demonstrates reducing the time to close issues for app freezes from user reports to fix verification, using gray-scale collection, APMS, and AI Skill.